Magnetization Dynamics of Synthetic Antiferromagnetic Thin Films and Nanostructures Investigated by Broadband Vector Network Analyzer Ferromagnetic Resonance

Heisemberg Samuel Tarazona Coronel1, Carlos Vladimir Landauro Sáenz1,2, Justiniano Quispe Marcatoma1,2, Daniel Markó3, David Schmool3

 Facultad de Ciencias Físicas, Universidad Nacional Mayor de San Marcos, P. O. Box 14-0149, Lima, Perú.
Centro de Investigaciones Tecnológicas, Biomédicas y Medioambientales, Calle José Santos Chocano 199, Bellavista, Callao, Perú.
Groupe d’Etude de la Matière Condensée (GEMaC), CNRS and Université de Versailles/Saint-Quentin-en-Yvelines, Université Paris-Saclay, 45, Avenue des Etats-Unis, 78035 Versailles Cedex, France. 


Characterisation of the dynamic magnetic properties of nanoscale magnetic thin films, nanostructures, and devices is crucial for exploiting their potential for practical applications such as in logic and microwave devices operating in the GHz region. Among the various techniques available for high-frequency characterisation, ferromagnetic resonance spectroscopy (FMR) is widely considered one of the gold standards. In its most advanced version, broadband vector network analyzer (VNA) FMR, it represents a perfect tool for detailed and accurate analysis of magnetodynamic behavior, including damping processes. In the first part of my talk, the underlying physics as well as technical details of FMR will be discussed, followed by a short presentation of a recently built VNA-FMR setup at GEMaC, UVSQ. In the second part, the influence of different seed and capping layers (Ti, Ag/Ti, Ta/Ti) on the dynamic magnetic properties of synthetic antiferromagnets based on Fe/Ti/Fe trilayers (full films and nanodots) will be discussed.

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